Int. J. of High Speed Electronics and Sys. - Free Online Issue

International Journal of High Speed Electronics and Systems Vol. 14, No. 2 (June 2004)

Special Issue On Radiation Effects And Soft Errors In Integrated Circuits And Electronic Devices Edited by R. D. Schrimpf and D. M. Fleetwood

The electronic version of this issue is available from the journal's web site at no charge. View table-of-contents and abstracts at

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Contents:

Preface

Single Event Effects In Avionics And On The Ground Eugene Normand

Soft Errors In Commercial Integrated Circuits R=2E C. Baumann

Single-Event Effects In Iii-V Semiconductor Electronics Dale Mcmorrow, Joseph S. Melinger And Alvin R. Knudson

Investigation Of Single-Event Transients In Fast Integrated Circuits With A Pulsed Laser P=2E Fouillat, V. Pouget, D. Lewis, S. Buchner And D. Mcmorrow

System Level Single Event Upset Mitigation Strategies W=2E F. Heidergott

Radiation-Tolerant Design For High Performance Mixed-Signal Circuits W=2E T. Holman

A Total-Dose Hardening-By-Design Approach For High-Speed Mixed-Signal Cmos Integrated Circuits Nathan Nowlin, John Bailey, Bob Turfler And Dave Alexander

Radiation Issues In The New Generation Of High Energy Physics Experiments F=2E Faccio

Space Radiation Effects In Optocouplers Robert A. Reed, Paul W. Marshall And Kenneth A. Label

Radiation Effects In Charge-Coupled Device (Ccd) Imagers And Cmos Active Pixel Sensors G=2E R. Hopkinson And A. Mohammadzadeh

The Effects Of Space Radiation Exposure On Power Mosfets: A Review K=2E Shenai, K.F. Galloway And R.D. Schrimpf

Introduction To Soi Mosfets: Context, Radiation Effects, And Future Trends Sorin Cristoloveanu And V=E9ronique Ferlet-Cavrois

Total-Dose And Single-Event Effects In Silicon-Germanium Heterojunction Bipolar Transistors John D. Cressler

Gain Degradation And Enhanced Low-Dose-Rate Sensitivity In Bipolar Junction Transistors R=2E D. Schrimpf

Total Dose Effects In Linear Bipolar Integrated Circuits H=2E J. Barnaby

Hardness Assurance For Commercial Microelectronics Ronald L. Pease

Ionizing Radiation Effects On Ultra-Thin Oxide Mos Structures A=2E Cester And A. Paccagnella

Hydrogen At The Si/Sio2 Interface: From Atomic-Scale Calculations To Engineering Models S=2E N. Rashkeev, D. M. Fleetwood, R. D. Schrimpf And S. T. Pantelides

Switching Oxide Traps Timothy R. Oldham

Online And Realtime Dosimetry Using Optically Stimulated Luminescence L=2E Dusseau And J. Gasiot

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WSKhoo
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des bouquins ou revues qui ont failli être en FRANÇAIS !!!

"WSKhoo" a écrit dans le message de news: snipped-for-privacy@g14g2000cwa.googlegroups.com... International Journal of High Speed Electronics and Systems Vol. 14, No. 2 (June 2004)

Special Issue On Radiation Effects And Soft Errors In Integrated Circuits And Electronic Devices Edited by R. D. Schrimpf and D. M. Fleetwood

The electronic version of this issue is available from the journal's web site at no charge. View table-of-contents and abstracts at

formatting link
Contents:

Preface

Single Event Effects In Avionics And On The Ground Eugene Normand

Soft Errors In Commercial Integrated Circuits R. C. Baumann

Single-Event Effects In Iii-V Semiconductor Electronics Dale Mcmorrow, Joseph S. Melinger And Alvin R. Knudson

Investigation Of Single-Event Transients In Fast Integrated Circuits With A Pulsed Laser P. Fouillat, V. Pouget, D. Lewis, S. Buchner And D. Mcmorrow

System Level Single Event Upset Mitigation Strategies W. F. Heidergott

Radiation-Tolerant Design For High Performance Mixed-Signal Circuits W. T. Holman

A Total-Dose Hardening-By-Design Approach For High-Speed Mixed-Signal Cmos Integrated Circuits Nathan Nowlin, John Bailey, Bob Turfler And Dave Alexander

Radiation Issues In The New Generation Of High Energy Physics Experiments F. Faccio

Space Radiation Effects In Optocouplers Robert A. Reed, Paul W. Marshall And Kenneth A. Label

Radiation Effects In Charge-Coupled Device (Ccd) Imagers And Cmos Active Pixel Sensors G. R. Hopkinson And A. Mohammadzadeh

The Effects Of Space Radiation Exposure On Power Mosfets: A Review K. Shenai, K.F. Galloway And R.D. Schrimpf

Introduction To Soi Mosfets: Context, Radiation Effects, And Future Trends Sorin Cristoloveanu And Véronique Ferlet-Cavrois

Total-Dose And Single-Event Effects In Silicon-Germanium Heterojunction Bipolar Transistors John D. Cressler

Gain Degradation And Enhanced Low-Dose-Rate Sensitivity In Bipolar Junction Transistors R. D. Schrimpf

Total Dose Effects In Linear Bipolar Integrated Circuits H. J. Barnaby

Hardness Assurance For Commercial Microelectronics Ronald L. Pease

Ionizing Radiation Effects On Ultra-Thin Oxide Mos Structures A. Cester And A. Paccagnella

Hydrogen At The Si/Sio2 Interface: From Atomic-Scale Calculations To Engineering Models S. N. Rashkeev, D. M. Fleetwood, R. D. Schrimpf And S. T. Pantelides

Switching Oxide Traps Timothy R. Oldham

Online And Realtime Dosimetry Using Optically Stimulated Luminescence L. Dusseau And J. Gasiot

For more information, go to

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willpot

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