You are invited to attend a live, interactive, web-based instructional seminar:
========================================================================= "Sieve Calibration and Particle Characterization Using Digital Image Analysis"
Presented by Marc Landman, President of Vision Machines Inc. =========================================================================
Details are below. Connection lines are limited, so reserve yours now. There is no charge to participate in this on-line seminar.
When ===================== Thursday, March 6
1:30 PM (New York time) Duration: About 45 minutes, plus questions and answersPre-register (required) at:
Attendees will learn about a cost-effective instrument that can perform both sieve calibration and particle characterization using state-of-the-art optics and digital image analysis. For sieves, hundreds of openings and wire diameters can be scanned and measured in a matter of seconds. For particles, size distributions and shape information such as area, roundness, aspect ratio, and mean diameter can be quickly generated.
Bring your questions to this live, interactive web-based seminar.
Subjects include:
Overview and limitations of current sieve calibration and particle analysis methods Benefits of an integrated sieve calibration and particle analysis instrument Camera, optics, and lighting for capturing high-quality images of sieves and particles Simplified "wizard" interface for certifying sieves and measuring particles Archiving measurement data and images Live software demo Question and answer session
Provided at no cost, this webinar is sponsored by MAG, the Microimaging Applications Group. MAG is a group of imaging companies who work together to provide an unparalleled range of microimaging solutions to science and industry.
About the presenter ===================== Marc Landman is the President of Vision Machines Inc., a firm specializing in product development and integration of machine vision and image analysis technologies. Mr. Landman has over 25 years experience implementing machine vision and image processing systems, and is the principal developer of the Automated Sieve and Particle Analysis system. Educated at the State University of New York and Boston University, Mr. Landman has performed cutting-edge work in the areas of 3-D vision, color image recognition, and particle analysis.