What are the pros and cons between probing directly at a via and probing a dedicated test pin?
How does the design for testability need to change as signal frequencies are in the higher ranges (> 100Mhz)? (ie: Probe types, reduction of overshoot, ringing, etc...)
Thank you for any advise!
Vias can be pretty small. Test pads can be sized for the test equipment.
Generally, one doesn't test high frequency signals directly. Either test indirectly or measure device parametrics.
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