Phat Bytestard wrote
We'll see...
Bullshit it does. In spades when you are stupid enough to use laptop drives.
Still a single point of failure. Multiple machines dont have that.
Depends on how the raid hardware dies.
Pity that aint guaranteed with raid.
The multiple machines leaves it for dead.
Phat Bytestard wrote
Liar.
That aint a 'factory burn in lab'
No thanks, they keep breaking when I do that.
No it isnt. I didnt even use it in that post.
Phat Bytestard wrote
You havent read them all, child.
Phat Bytestard wrote
Wrong, as always. And he said parts, not components anyway.
Pity about hard drives.
Well, ok then. Might have been an overreaction on my part.
Arno
True.
Arno
Is "burning-in" a form of test? I thought it was a form of usage concentrated into a short period of time.
Nope.
Yes, and often at higher than usual temperatures too.
Never suggested otherwise.
"Certain parts" meant certain whole products, in other words companies don't just throw everything into an oven, the burn-in test is in the context of what the part is.
Calling something "component" is rather arbitrary, in the context of an entire computer a whole hard drive, for example, could likewise be called one component.
Wrong.
It was a noteworthy thing to subject some parts to a very high temp, as in an oven, thus "burn-in" became a generic term for it but the term burn-in is not exclusionary, still applied likewise to other parts undergoing the same testing criteria but that didn't need testing at THAT high a temp.
On Sun, 30 Jul 2006 06:37:32 +1000, "Rod Speed" Gave us:
You're an idiot. A raid 3 array has the potential to have 8 times the throughput, placing the bottleneck on other subsystems.
On Sun, 30 Jul 2006 06:40:40 +1000, "Rod Speed" Gave us:
A hot test after manufacturing at the factory IS the definition of "burn-in testing", you retarded f*ck.
On Sun, 30 Jul 2006 06:40:40 +1000, "Rod Speed" Gave us:
I have no doubts about that whatsoever.
On Sun, 30 Jul 2006 06:43:50 +1000, "Rod Speed" Gave us:
You're an idiot. The two words are synonymous, and particularly so in this case.
What is the pity, you incomplete thought twit?
Call WD and ask them if they test their drives... ALL of their drives. Get a clue, boy.
On Sun, 30 Jul 2006 00:23:31 +0100, Joe S Gave us:
Burn-in testing is usually a test done in an elevated temperature AT RATED output for a specific period of time, and is meant to catch component abnormalities which cause complete system failures.
In the old days, it exposed everything from bad solder joints (modern processes have all but done away with poor soldering, except for the new RoHS CRAP), to bad lead frame connections in chips, which were less reliable in the days of old as well, to poor mechanical tolerances.
On Sun, 30 Jul 2006 09:48:08 +1000, "Rod Speed" Gave us:
NO. NOT "often". ALWAYS. That is the very definition of the test process.
If it is not, it is merely a live, pre-shipping test, not a "burn-in".
On Sat, 29 Jul 2006 21:09:26 -0400, kony Gave us:
Not at all. If you work in electronics, it has a very specific meaning.
We were talking about hard drives here. Get a clue.
You are wrong.
Not generic at all, dipshit. In fact, the term has a quite specific meaning in the industry, before dopes like you started generisizing everything.
Wrong again. ENTIRE rooms are utilized at elevated temperatures, not just some "oven". Hence the term "burn-in lab".
You two were meant to be together.
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>Phat Bytestard wrote
You're a terminal pig ignorant f****it.
Nice theory, pity about the reality, child.
And anyone who cares about thruput, doesnt use laptop drives.
Phat Bytestard wrote
You're a terminal pig ignorant f****it.
Wrong, as always.
Pathetic, really.
Nothing even remotely resembling anything like your pig ignorant drivel about 'factory burn in labs'
Phat Bytestard wrote
Wrong, as always.
Wrong, as always.
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