I have to work with SEM data coming from metallic lines on insulating samples all the time. What guarantees are there that charging is not throwing an element of random distortions into my data?
I know that at a suitably low voltage, this can be controlled to some extent since secondary electron emission can balance the incident electron flux. But this control must be material dependent and I doubt complete cancellation is always possible.
Are there ways to avoid this type of uncertainty?
Thanks, Fred